Title: Effect of rotation, gate-dielectric and SEG on the noise behavior of advanced SOI MuGFETs
Authors: Put, Sofie ×
Harsh, Mehta
Collaert, Nadine
Van Uffelen, Marco
Leroux, Paul
Claeys, Corneel
Lukyanchikova, N.
Simoen, Eddy #
Issue Date: Feb-2010
Publisher: Pergamon Press
Series Title: Solid-State Electronics vol:54 issue:2 pages:178-184
ISSN: 0038-1101
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
Technologiecluster ESAT Elektrotechnische Engineering
Electrical Engineering (ESAT) TC, Technology Campus Geel
× corresponding author
# (joint) last author

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