Title: Stopping Criteria for Less Expensive and High Quality MC-Based Analog IC Yield Optimization
Authors: Liu, Bo
Fernandez, Francisco V.
De Jonghe, Dimitri
Gielen, Georges #
Issue Date: 13-Dec-2009
Publisher: IEEE
Conference: IEEE International Conference on Electronics Circuits and Systems location:Tunisia date:13-16 December 2009
Abstract: This paper investigates the stopping criteria for Monte-Carlo (MC)-based yield optimization of analog
integrated circuits. Available stopping criteria are briefly
reviewed and a new adaptive criterion, called combined global and local improvement (ComImp) is presented. Experimental results show that the proposed stopping criterion has the following two advantages: (1) low risk of early termination before the optimum has been reached with the desired accuracy; (2) less additional function evaluations after the convergence has already been reached.
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
# (joint) last author

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