IEEE International Conference on Electronics Circuits and Systems location:Tunisia date:13-16 December 2009
This paper investigates the stopping criteria for Monte-Carlo (MC)-based yield optimization of analog
integrated circuits. Available stopping criteria are briefly
reviewed and a new adaptive criterion, called combined global and local improvement (ComImp) is presented. Experimental results show that the proposed stopping criterion has the following two advantages: (1) low risk of early termination before the optimum has been reached with the desired accuracy; (2) less additional function evaluations after the convergence has already been reached.