Title: Influence of the dielectric roughness on the performance of pentacene transistors
Authors: Steudel, Soeren ×
De Vusser, Stijn
De Jonge, Stijn
Janssen, Dimitri
Verlaak, Stijn
Genoe, Jan
Heremans, Paul #
Issue Date: Nov-2004
Publisher: Amer inst physics
Series Title: Applied Physics Letters vol:85 issue:19 pages:4400-4402
Abstract: The properties of the dielectric strongly influence the performance of organic thin-film transistors. In this letter, we show experimental results that quantify the influence of the roughness of the dielectric on the mobility of pentacene transistors and discuss the cause of it. We consider the movement of charge carriers out of the "roughness valleys" or across those valleys at the dielectric-semiconductor interface as the limiting step for the roughness-dependent mobility in the transistor channel. (C) 2004 American Institute of Physics.
ISSN: 0003-6951
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Molecular Design and Synthesis
ESAT - MICAS, Microelectronics and Sensors
Electrical Engineering (ESAT) TC, Technology Campus Diepenbeek
Technologiecluster ESAT Elektrotechnische Engineering
Materials Technology TC, Campus Group T Leuven
Technologiecluster Materialentechnologie
× corresponding author
# (joint) last author

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