Title: On-Wafer LSNA Measurements Including Dynamic Bias
Authors: Avolio, Gustavo
Pailloncy, G.
Schreurs, Dominique
Vanden Bossche, M.
Nauwelaers, Bart
Issue Date: Sep-2009
Host Document: European Microwave Conference (EuMC) pages:930-933
Conference: European Microwave Conference (EuMC) location:Rome, Italy date:29 September - 1 October 2009
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves

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