Title: Impact of Random Soft Oxide Breakdown on SRAM Energy/Delay Drift
Authors: Hua, Wang ×
Miranda, M.
Catthoor, Franky
Dehaene, Wim #
Issue Date: Dec-2007
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Device and Materials Reliability vol:7 issue:4 pages:581-591
ISSN: 1530-4388
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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