Title: Design, Assessment and Modeling of an Integrated 0.4 μm SiGe Bipolar VCSEL Driver under gamma-Radiation
Authors: Leroux, Paul ×
De Cock, Wouter
Van Uffelen, Marco
Steyaert, Michel #
Issue Date: Aug-2009
Publisher: Professional Technical Group on Nuclear Science
Series Title: IEEE Transactions on Nuclear Science vol:56 issue:4 pages:1920-1925
ISSN: 0018-9499
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Technologiecluster ESAT Elektrotechnische Engineering
Electrical Engineering (ESAT) TC, Technology Campus Geel
× corresponding author
# (joint) last author

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