|ITEM METADATA RECORD
|Title: ||Scanning Spreading Resistance Microscopy: High Resolution Two-Dimensional Carrier Profiling of Semiconductor Structures (Scanning spreading resistance microscopy: hoge resolutie tweedimensionale ladingsdragersprofilering van halfgeleiderstructuren)|
|Other Titles: ||Scanning Spreading Resistance Microscopy: High Resolution Two-Dimensional Carrier Profiling of Semiconductor Structures|
|Authors: ||Eyben, Pierre; M9828576|
|Issue Date: ||23-Dec-2004 |
|Publication status: ||published|
|KU Leuven publication type: ||TH|
|Appears in Collections:||Nuclear and Radiation Physics Section|
Electrical Engineering - miscellaneous
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