ITEM METADATA RECORD
Title: Scanning Spreading Resistance Microscopy: High Resolution Two-Dimensional Carrier Profiling of Semiconductor Structures (Scanning spreading resistance microscopy: hoge resolutie tweedimensionale ladingsdragersprofilering van halfgeleiderstructuren)
Other Titles: Scanning Spreading Resistance Microscopy: High Resolution Two-Dimensional Carrier Profiling of Semiconductor Structures
Authors: Eyben, Pierre; M9828576
Issue Date: 23-Dec-2004
Publication status: published
KU Leuven publication type: TH
Appears in Collections:Nuclear and Radiation Physics Section
Electrical Engineering - miscellaneous

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