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Title: Modelling of charge trapping/Detrapping induced voltage instability in high-k Gate dielectrics
Authors: Sahhaf, Seyedeh Sahar ×
De Brabanter, Kris
Degraeve, R
Suykens, Johan
De Moor, Bart
Groeseneken, Guido #
Issue Date: Mar-2012
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Device and Materials Reliability vol:12 issue:1 pages:152-157
ISSN: 1530-4388
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - STADIUS, Stadius Centre for Dynamical Systems, Signal Processing and Data Analytics
Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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