Title: Evaluation of thin oxide layers by a microscratching technique
Authors: Van der Donck, Tom
Muchlado, M.
Celis, Jean-Pierre
Hausbrand, R.
Drees, Dirk #
Issue Date: 2009
Conference: Vienna International Conference edition:3 location:Vienna, Austria date:18-20 March 2009
Description: oral presentation + abstract
Publication status: published
KU Leuven publication type: IMa
Appears in Collections:Department of Materials Engineering - miscellaneous
Chemical and Extractive Metallurgy Section (-)
# (joint) last author

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