Title: Quasi-TEM approach for shunt admittance parameters calculations of VLSI on-chip interconnects
Authors: Ymeri, Hassan ×
Nauwelaers, Bart
Maex, Karen
De Roest, David #
Issue Date: 2003
Publisher: Electrotechnical Society of Slovenia
Series Title: Electrotechnical Review / Elektrotehniški vestnik vol:70 issue:5 pages:254-260
ISSN: 0013-5852
Publication status: published
KU Leuven publication type: AT
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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