Title: A new closed-form expressions for capacitance per unit length of VLSI interconnects
Authors: Nauwelaers, Bart ×
Ymeri, Hassan
Maex, Karen
De Roest, David
Vandenberghe, Servaas #
Issue Date: May-2001
Publisher: International Microelectronics and Packaging Society
Series Title: Journal of Microelectronics and Electronic Packaging vol:24 issue:2 pages:203-209
ISSN: 1551-4897
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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