Title: 3D Technology Assessment:Path-finding the Technology/Design sweet-spot
Authors: Marchal, P. ×
Bougard, B.
Guruprasad, K.
Stucchi, M.
Dehaene, Wim
Papanikolaou, A.
Verkest, D.
Swinnen, B.
Beyne, E. #
Issue Date: Jan-2009
Publisher: Institute of Electrical and Electronics Engineers
Series Title: Proceedings of the IEEE vol:97 issue:1 pages:96-107
ISSN: 0018-9219
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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