Proceedings of the International Symposium on EMC pages:103-108
EMC Europe 2008 location:Hamburg date:8-12 September 2008
This investigation focuses on setting up a discrete model of the coupling between a TEM field generated inside a TEM cell to a device under test for use in a circuit simulator. In first instance, different microstrips are used as device under test because of their well-defined characteristics. The resulting models of the TEM cell, the microstrips and the electric field coupling between them are explained. Comparison and validation by measurements is presented for all models.