|ITEM METADATA RECORD
|Title: ||Combination of high-resolution RBS and angle-resolved XPS: accurate depth profiling of chemical states. Surface and Interface Analysis|
|Authors: ||Kimura, Kenji|
Kim, Jung Jin
Vandervorst, Wilfried #
|Issue Date: ||Mar-2008 |
|Publisher: ||John Wiley & Sons|
|Series Title: ||Surface and Interface Analysis vol:40 issue:3-4 pages:423-426|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Nuclear and Radiation Physics Section|
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