Title: Combination of high-resolution RBS and angle-resolved XPS: accurate depth profiling of chemical states. Surface and Interface Analysis
Authors: Kimura, Kenji
Nakajima, Kaoru
Zhao, Ming
Nohira, Hiroshi
Hattori, Takeo
Kobata, Masaaki
Ikenaga, Eiji
Kim, Jung Jin
Kobayashi, Keisuku
Conard, Thierry
Vandervorst, Wilfried #
Issue Date: Mar-2008
Publisher: John Wiley & Sons
Series Title: Surface and Interface Analysis vol:40 issue:3-4 pages:423-426
ISSN: 0142-2421
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Nuclear and Radiation Physics Section
# (joint) last author

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