Title: Towards quantitative depth profiling with high spatial and high depth resolution
Authors: Vanhove, Nico ×
Lievens, Peter
Vandervorst, Wilfried #
Issue Date: Dec-2008
Publisher: New York
Series Title: Applied Surface Science vol:255 issue:4 pages:1360-1363
ISSN: 0169-4332
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Nuclear and Radiation Physics Section
Solid State Physics and Magnetism Section
× corresponding author
# (joint) last author

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