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Title: Fruit microstructure evaluation using synchrotron X-ray computed tomography
Authors: Verboven, Pieter
Kerckhofs, Greet
Mebatsion, Hibru Kelemu
Wevers, Martine
Cloetens, Peter
Nicolai, Bart #
Issue Date: 2008
Host Document: Tenth International Congress on Engineering and Food Program Book and Abstracts
Conference: ICEF edition:10 location:Vina del Mar, Chili date:20-24 April, 2008
Article number: 80-6
Publication status: published
KU Leuven publication type: IMa
Appears in Collections:Division of Mechatronics, Biostatistics and Sensors (MeBioS)
Department of Materials Engineering - miscellaneous
Mechanical Metallurgy Section (-)
# (joint) last author

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