|ITEM METADATA RECORD
|Title: ||Simulations of bias temperature instabilities in pMOSFETs with HfSiO-based gate dielectrics|
|Authors: ||Bizzari, C|
Autran, J-L #
|Issue Date: ||2003 |
|Conference: ||ECS Fall Meeting location:Orlando, USA date:12-17 October 2003|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Semiconductor Physics Section|
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