Title: Simulations of bias temperature instabilities in pMOSFETs with HfSiO-based gate dielectrics
Authors: Bizzari, C
Houssa, Michel
Autran, J-L #
Issue Date: 2003
Publisher: ECS
Conference: ECS Fall Meeting location:Orlando, USA date:12-17 October 2003
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Semiconductor Physics Section
# (joint) last author

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