Title: Characterization of atomic-beam deposited GeON/HfO2 stacks on Ge
Authors: Houssa, Michel
Conard, T
Mavrou, G
Dimoulas, A
Meuris, M
Caymax, M
Heyns, Marc #
Issue Date: 2005
Publisher: ECS
Conference: ECS Fall Meeting location:Los Angeles date:16-21 October 2005
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Semiconductor Physics Section
Department of Materials Engineering - miscellaneous
# (joint) last author

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