Title: Negative bias temperature instabilities in high-k based MOSFETs
Authors: Houssa, Michel
Aoulaiche, M
De Gendt, Stefan
Groeseneken, Guido
Heyns, Marc
Stesmans, Andre #
Issue Date: 2005
Publisher: MRS
Conference: MRS Spring Meeting location:San Francisco date:28 march-1 april 2005
Article number: Invited Paper
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Semiconductor Physics Section
Molecular Design and Synthesis
Electrical Engineering - miscellaneous
Department of Materials Engineering - miscellaneous
# (joint) last author

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