Title: Reliability Simulation of Analog ICs under Time-varying Stress in Nanoscale CMOS
Authors: Maricau, Elie
Gielen, Georges #
Issue Date: 2008
Host Document: ITC DRVW
Conference: ITC DRVW date:2008
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
# (joint) last author

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