Title: Electrical characterization, modelling and simulation of MOS structures with high-k gate stacks
Authors: Autran, J-L
Munteanu, D
Houssa, Michel
Issue Date: 2004
Publisher: Institute of Physics Publishing
Host Document: High-k Gate Dielectrics pages:251-289
Publication status: published
KU Leuven publication type: IHb
Appears in Collections:Semiconductor Physics Section

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