|ITEM METADATA RECORD
|Title: ||Electrical characterization, modelling and simulation of MOS structures with high-k gate stacks|
|Authors: ||Autran, J-L|
|Issue Date: ||2004 |
|Publisher: ||Institute of Physics Publishing|
|Host Document: ||High-k Gate Dielectrics pages:251-289|
|Publication status: ||published|
|KU Leuven publication type: ||IHb|
|Appears in Collections:||Semiconductor Physics Section|
|Files in This Item:
There are no files associated with this item.
Request a copy
All items in Lirias are protected by copyright, with all rights reserved.