Title: Effect of electric field on trapping of holes in silicon-oxide-semiconductor structures
Authors: Akulov, A. Ph. ×
Afanas'ev, Valeri #
Issue Date: 1992
Publisher: American Institute of Physics
Series Title: Technical physics letters vol:18 issue:19-20 pages:21-24
ISSN: 1063-7850
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Semiconductor Physics Section
× corresponding author
# (joint) last author

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