Title: SiC/SiO2 interface defects
Authors: Afanas'ev, Valeri
Issue Date: 2000
Publisher: Kluwer Academic Publishers
Host Document: Defects in SiO2 and related dielectrics: Science and Technology pages:581-597
ISBN: 0-7923-6685-9
Publication status: published
KU Leuven publication type: IHb
Appears in Collections:Semiconductor Physics Section

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