Title: Reliability issues in high-k based devices
Authors: Houssa, Michel
Degraeve, R
Kauerauf, T
Aoulaiche, M
Groeseneken, Guido
De Gendt, Stefan
Heyns, Marc #
Issue Date: 2005
Publisher: ECS
Conference: SEMI-ECS International Semiconductor Technology Conference location:Shangai date:15-17 march 2005
Article number: Invited Paper
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Semiconductor Physics Section
Electrical Engineering - miscellaneous
Molecular Design and Synthesis
Department of Materials Engineering - miscellaneous
# (joint) last author

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