Title: Positive bias temperature instability in nMOSFET with ultrathin Hf silicate gate dielectrics
Authors: Crupi, Felice ×
Pace, C
Cocorullo, G
Groeseneken, Guido
Aoulaiche, Marc
Houssa, Michel #
Issue Date: Jun-2005
Publisher: North-Holland
Series Title: Microelectronic Engineering vol:80 pages:130-133
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Semiconductor Physics Section
× corresponding author
# (joint) last author

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