Title: Determination of oxide charge repartition in memory tunnel oxide under electrical stress
Authors: Bernardini, S
Masson, P
Houssa, Michel
Lalande, F #
Issue Date: 2003
Conference: ESSDERC location:Portugal date:September 2003
Publication status: published
KU Leuven publication type: IMa
Appears in Collections:Semiconductor Physics Section
# (joint) last author

Files in This Item:

There are no files associated with this item.


All items in Lirias are protected by copyright, with all rights reserved.