|ITEM METADATA RECORD
|Title: ||Determination of oxide charge repartition in memory tunnel oxide under electrical stress|
|Authors: ||Bernardini, S|
Lalande, F #
|Issue Date: ||2003 |
|Conference: ||ESSDERC location:Portugal date:September 2003|
|Publication status: ||published|
|KU Leuven publication type: ||IMa|
|Appears in Collections:||Semiconductor Physics Section|
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