Title: Structural characterization of multilayered nanostructures by X-ray diffraction and scanning probe microscopy
Other Titles: (invited talk; host: Prof. V. Valvoda)
Authors: Temst, Kristiaan #
Issue Date: Aug-1998
Conference: European Crystallographic Meeting location:Prague, Czech republic date:August 1998
Publication status: published
KU Leuven publication type: IMa
Appears in Collections:Nuclear and Radiation Physics Section
# (joint) last author

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