|ITEM METADATA RECORD
|Title: ||Structural characterization of multilayered nanostructures by X-ray diffraction and scanning probe microscopy|
|Other Titles: ||(invited talk; host: Prof. V. Valvoda)|
|Authors: ||Temst, Kristiaan #|
|Issue Date: ||Aug-1998 |
|Conference: ||European Crystallographic Meeting location:Prague, Czech republic date:August 1998|
|Publication status: ||published|
|KU Leuven publication type: ||IMa|
|Appears in Collections:||Nuclear and Radiation Physics Section|
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