Title: Characteristic impedance extraction using calibration comparison
Authors: Vandenberghe, Servaas
Schreurs, Dominique ×
Nauwelaers, Bart
De Raedt, Walter #
Issue Date: Dec-2001
Publisher: Professional Technical Group on Microwave Theory and Techniques, Institute of Electrical and Electronics Engineers
Series Title: IEEE transactions on microwave theory and techniques vol:49 issue:12 pages:2573-2579
ISSN: 0018-9480
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
× corresponding author
# (joint) last author

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