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Title: Design and Assessment of a High Gamma-Dose Tolerant VCSEL Driver with Discrete SiGe HBT's
Authors: Leroux, Paul ×
Van Uffelen, Marco
Berghmans, Francis
Giraud, Alain #
Issue Date: Aug-2006
Publisher: Professional Technical Group on Nuclear Science
Series Title: IEEE Transactions on Nuclear Science vol:53 issue:4 pages:2033-2039
Conference: 8th European Conference on Radiation and Its Effects on Components and Systems location:Cap d'Agde, France date:19-23 Sept. 2005
ISSN: 0018-9499
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
Technologiecluster ESAT Elektrotechnische Engineering
Electrical Engineering (ESAT) TC, Technology Campus Geel
× corresponding author
# (joint) last author

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