Acta Physica Polonica A vol:112 issue:6 pages:1313-1318
International Workshop on Smoothing and Characterization of Magnetic Films for Advanced Devices location:Krakow, Poland date:4-6 July 2007
The continued growth of storage capacity requires new innovations in recording media and in particular, in magnetic nanostructures. FePt thin films in the L1(0)-phase are interesting candidates for high-density magnetic recording media due to their large magnetocrystalline anisotropy. In the present work, we investigated the magnetic and structural properties of FePt thin films directly grown on MgO(110) with molecular beam epitaxy. The purpose was to gain insight in the correlation between the magnetization process and the morphology of the FePt thin films. We introduce conversion electron Mossbauer spectroscopy to derive the direction of the easy magnetization axis with respect to the substrate. The results are compared to the characterization performed with high angle X-ray diffraction.