Title: Deriving distance metrics from generality relations
Authors: De Raedt, Luc ×
Ramon, Jan #
Issue Date: Feb-2009
Publisher: North Holland
Series Title: Pattern Recognition Letters vol:30 issue:3 pages:187-191
Abstract: Many pattern recognition and machine learning approaches employ a distance metric on patterns, or a generality relation to partially order the patterns. We investigate the relationship amongst them and prove a theorem that shows how a distance metric can be derived from a partial order (and a corresponding size on patterns) under mild conditions. We then discuss the use of the theorem. More specfically, we show how well-known distance metrics for sets, strings, trees and graphs can be derived from their generality relation.
ISSN: 0167-8655
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Informatics Section
× corresponding author
# (joint) last author

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