|ITEM METADATA RECORD
|Title: ||Weibull distribution as applied to EPMA, Electron Probe Micro-analysis|
|Authors: ||Kuczumow, A|
Helsen, Jozef #
|Issue Date: ||1993 |
|Host Document: ||Proc. International Congress X-ray Optics and Microanalysis pages:149-152|
|Conference: ||location:Manchester date:1993|
|Description: ||Inst. Phys. Conf. Ser. No. 130, Chapter 2|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Department of Materials Engineering - miscellaneous|
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