Title: Weibull distribution as applied to EPMA, Electron Probe Micro-analysis
Authors: Kuczumow, A
Helsen, Jozef #
Issue Date: 1993
Host Document: Proc. International Congress X-ray Optics and Microanalysis pages:149-152
Conference: location:Manchester date:1993
Description: Inst. Phys. Conf. Ser. No. 130, Chapter 2
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Department of Materials Engineering - miscellaneous
# (joint) last author

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