Title: Internal stress measurement on CVD diamond coatings by X-ray diffraction and Raman spectroscopy
Authors: Van Acker, Karel
Mohrbacher, Hardy
Blanpain, Bart
Van Houtte, Paul
Celis, Jean-Pierre #
Issue Date: 1993
Publisher: Materials Research Soc.
Host Document: Thin Films: Stresses and Mechanical Properties IV vol:308 pages:677-682
Series Title: Materials Research Society Symposium Proceedings
Conference: Symposium on Thin Films: Stresses and Mechanical Properties IV, at the 1993 Spring Meeting of the Materials-Research-Society location:San Francisco, CA, USA date:12-16 April 1993
ISBN: 1-55899-204-9
ISSN: 0272-9172
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Chemical and Extractive Metallurgy Section (-)
Department of Materials Engineering - miscellaneous
Mechanical Metallurgy Section (-)
Sustainable Metals Processing and Recycling
# (joint) last author

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