Title: Using cepstrum analysis to improve the depth resolution of ultrasonic C-scan on layered materials
Authors: Desmet, C
Lauriks, Walter
Kawald, U
Thoen, Jan
Wevers, Martine #
Issue Date: 1994
Host Document: Proc. Phase Symposium pages:101-104
Conference: location:Valencia, Spain date:1994
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Soft Matter and Biophysics
Mechanical Metallurgy Section (-)
# (joint) last author

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