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Title: Characterization of sialon ceramics by EPMA and TEM
Authors: Vleugels, Jef
Laoui, Tahar
Wouters, M
Van der Biest, Omer #
Issue Date: Sep-1992
Host Document: Proc. XII ICXOM '92, 13th International Congress on X-ray Optics and Microanalysis
Conference: location:Manchester date:31 Aug. - 4 Sep. 1992
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Physical Metallurgy and Materials Engineering Section (-)
Mechanical Metallurgy Section (-)
# (joint) last author

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