|ITEM METADATA RECORD
|Title: ||Electron spin resonance observation of Si dangling bond type defects at the interface of (100)Si and ultrathin stacks of SiO2 , Al2O3, and ZrO2|
|Authors: ||Stesmans, Andre|
Afanas'ev, Valeri #
|Issue Date: ||2000 |
|Host Document: ||31st IEEE semiconductor interface specialists conference, San Diego, USA, 7-9/12/2000|
|Conference: ||31st IEEE semiconductor interface specialists conference location:San Diego, USA date:7-9/12/2000|
|Publication status: ||published|
|KU Leuven publication type: ||IMa|
|Appears in Collections:||Semiconductor Physics Section|
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