Title: High-resolution frequency-domain reflectometry by estimation of modulated superimposed complex sinusoids
Authors: Van hamme, Hugo #
Issue Date: 1992
Conference: IMTC-IEEE instrumentation and measurement technology conference location:New York, USA date:May 12-14
Description: Conference record IMTC-IEEE instrumentation and measurement technology conference, pp. 106-113, May 12-14, 1992, New York, USA
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - PSI, Processing Speech and Images
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science