|ITEM METADATA RECORD
|Title: ||Fast and high-quality planar contour following in the presence of large position uncertainties|
|Authors: ||Demey, Sabin|
De Schutter, Joris #
|Issue Date: ||May-1995 |
|Host Document: ||Proceedings of the IEEE International Conference on Robotics and Automation pages:2096-2101|
|Conference: ||IEEE International Conference on Robotics and Automation location:Nagoya, Japan date:May 21-24, 1995|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Production Engineering, Machine Design and Automation (PMA) Section|
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