ITEM METADATA RECORD
Title: Fast and high-quality planar contour following in the presence of large position uncertainties
Authors: Demey, Sabin
De Schutter, Joris #
Issue Date: May-1995
Host Document: Proceedings of the IEEE International Conference on Robotics and Automation pages:2096-2101
Conference: IEEE International Conference on Robotics and Automation location:Nagoya, Japan date:May 21-24, 1995
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Production Engineering, Machine Design and Automation (PMA) Section
# (joint) last author

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