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Title: A BIMOS diode matrix for the characterization of static and transient thermal phenomena on silicon
Authors: Geeraerts, Ben ×
Van Petegem, Wim
Sansen, Willy #
Issue Date: 1993
Host Document: IEE Semiconductor Thermal Measurement and Management Symposium pages:108-111
Conference: IEE Semiconductor Thermal Measurement and Management Symposium location:Austin, USA date:February 2-4
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Electrical Engineering - miscellaneous
Media and Learning Unit (-)
× corresponding author
# (joint) last author

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