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Title: A testset for automatic characterisation of opamps in the frequency domain
Authors: Van Grieken, Chris
Sansen, Willy #
Issue Date: 1993
Host Document: IEEE International Conference on Microelectronic Test Structures vol:6 pages:83-88
Conference: IEEE International Conference on Microelectronic Test Structures location:Barcelona, Spain date:March 22-25
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
# (joint) last author

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