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Title: Thermal measurements by use of a SBIMOS diode matrix
Authors: Geeraerts, Ben
Van Petegem, Wim
Sansen, Willy #
Issue Date: 1993
Host Document: IEEE International Conference on Microelectronic Test Structures vol:6 pages:183-187
Conference: IEEE International Conference on Microelectronic Test Structures location:Barcelona, Spain date:March 22-25
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Electrical Engineering - miscellaneous
Media and Learning Unit (-)
# (joint) last author

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