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ITEM METADATA RECORD
Title: Statistics for matching
Authors: Pergoot, A
Graindourze, B
Janssens, Edmond
Bastos, Jose
Steyaert, Michel
Kinget, Peter
Roovers, Raf
Sansen, Willy #
Issue Date: 1995
Host Document: IEEE International Conference on Microelectronic Test Structures pages:193-197
Conference: IEEE International Conference on Microelectronic Test Structures location:Nara, Japan date:March 22-25
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Electrical Engineering - miscellaneous
# (joint) last author

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