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|ITEM METADATA RECORD
|Title: ||Mismatch characterization of small size MOS transistors|
|Authors: ||Bastos, Jose|
Janssens, Edmond #
|Issue Date: ||1995 |
|Host Document: ||IEEE International Conference on Microelectronic Test Structures pages:271-276|
|Conference: ||IEEE International Conference on Microelectronic Test Structures location:Nara, Japan date:March 22-25|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||ESAT - MICAS, Microelectronics and Sensors|
Electrical Engineering - miscellaneous
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