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Title: Mismatch characterization of small size MOS transistors
Authors: Bastos, Jose
Steyaert, Michel
Roovers, Raf
Kinget, Peter
Sansen, Willy
Graindourze, B
Pergoot, A
Janssens, Edmond #
Issue Date: 1995
Host Document: IEEE International Conference on Microelectronic Test Structures pages:271-276
Conference: IEEE International Conference on Microelectronic Test Structures location:Nara, Japan date:March 22-25
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Electrical Engineering - miscellaneous
# (joint) last author

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