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Title: Test structures for HF characterization of fully differential building blocks
Authors: Peeters, Erik
Steyaert, Michel
Sansen, Willy #
Issue Date: 1996
Host Document: IEEE International Conference on Microelectronic Test Structures pages:179-183
Conference: IEEE International Conference on Microelectronic Test Structures location:Trento, Italy date:March 25-28
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Electrical Engineering - miscellaneous
# (joint) last author

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