Title: Nonlinear behavioral modeling and phase noise evaluation in phase locked loops
Authors: De Smedt, Bart
Gielen, Georges #
Issue Date: 1998
Host Document: IEEE Custom Integrated Circuits Conference (CICC) pages:53-56
Conference: IEEE Custom Integrated Circuits Conference (CICC) location:Santa Clara, USA date:May 11-14
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Electrical Engineering - miscellaneous
# (joint) last author

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