ITEM METADATA RECORD
Title: Assessment of the DPI Standard for Immunity Simulation of Integrated Circuits
Authors: Loeckx, Johan
Gielen, Georges #
Issue Date: 2007
Host Document: IEEE International Symposium on Electromagnetic Compatibility
Conference: IEEE International Symposium on Electromagnetic Compatibility
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
# (joint) last author

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