|ITEM METADATA RECORD
|Title: ||Assessment of the DPI Standard for Immunity Simulation of Integrated Circuits|
|Authors: ||Loeckx, Johan|
Gielen, Georges #
|Issue Date: ||2007 |
|Host Document: ||IEEE International Symposium on Electromagnetic Compatibility|
|Conference: ||IEEE International Symposium on Electromagnetic Compatibility|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||ESAT - MICAS, Microelectronics and Sensors|
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