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Title: Threshold voltage mismatch in short-channel MOS transistors
Authors: Steyaert, Michel
Bastos, Jose
Roovers, Raf
Kinget, Peter
Sansen, Willy
Graindourze, B
Pergoot, A
Janssens, Edmond #
Issue Date: 1-Sep-1994
Publisher: Iee-inst elec eng
Series Title: IEE Electronics Letters vol:30 issue:18 pages:1546-1548
Abstract: The threshold voltage matching dependency on device area is investigated for a standard 1.2 mu m CMOS technology. A deviation from the linear dependency of the threshold voltage matching on the inverse of the square root of the effective channel area is observed for transistors of 1.2 mu m channel length.
URI: 
ISSN: 0013-5194
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Electrical Engineering - miscellaneous
# (joint) last author

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