Title: Measurement of EMI induced input offset voltage of an operational amplifier
Authors: Redouté, Jean-Michel ×
Steyaert, Michel #
Issue Date: 2007
Publisher: Institution of Electrical Engineers
Series Title: Electronics Letters vol:43 issue:20 pages:1088-1090
ISSN: 0013-5194
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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