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Title: Critical review of visual inspection
Authors: Suetens, Paul
Oosterlinck, André #
Issue Date: 1985
Host Document: digital image processing vol:528 pages:240-254
Conference: SPIE, digital image processing location:Los Angeles, California, USA date:January 22-23
Description: Proceedings SPIE, digital image processing, vol. 528, pp. 240-254, January 22-23, 1985, Los Angeles, California, USA
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - PSI, Processing Speech and Images
Electrical Engineering - miscellaneous
# (joint) last author

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