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Title: Artificial intelligence in vision systems for future factories
Authors: Chen, M.J.W
Suetens, Paul
Oosterlinck, André #
Issue Date: 1985
Host Document: 4th annual test & measurement world expo pages:654-663
Conference: 4th annual test & measurement world expo location:San Jose, California, USA date:May 14-16, 1985
Description: Proceedings 4th annual test & measurement world expo, pp. 654-663, May 14-16, 1985, San Jose, California, USA
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - PSI, Processing Speech and Images
Electrical Engineering - miscellaneous
# (joint) last author

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