This item still needs to be validated !
ITEM METADATA RECORD
Title: Artificial intelligence in vision systems for future factories
Authors: Chen, M.J.W
Suetens, Paul
Oosterlinck, André #
Issue Date: 1985
Host Document: 4th annual test & measurement world expo pages:654-663
Conference: 4th annual test & measurement world expo location:San Jose, California, USA date:May 14-16, 1985
Description: Proceedings 4th annual test & measurement world expo, pp. 654-663, May 14-16, 1985, San Jose, California, USA
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - PSI, Processing Speech and Images
Electrical Engineering - miscellaneous
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy

 




All items in Lirias are protected by copyright, with all rights reserved.